Post by jacob on Jan 10, 2023 21:01:44 GMT -5
Hi, hope you're having a good day!
We are using the Cryotronics 8400 Series Hall measurement system, and plan to measure lightly doped materials.
I am aware that for lightly doped materials, thermionic emission may affect the contact resistance. In this situation, is it advised to use the cryogenic chamber for low temperature measurements?
I am also aware that a carrier depletion region may form. May the system take this into account when calculating the carrier concentration and carrier mobility?
Also keen to be recommended papers for taking hall measurements on lightly doped materials.
Thank you,
Jacob
We are using the Cryotronics 8400 Series Hall measurement system, and plan to measure lightly doped materials.
I am aware that for lightly doped materials, thermionic emission may affect the contact resistance. In this situation, is it advised to use the cryogenic chamber for low temperature measurements?
I am also aware that a carrier depletion region may form. May the system take this into account when calculating the carrier concentration and carrier mobility?
Also keen to be recommended papers for taking hall measurements on lightly doped materials.
Thank you,
Jacob